Tile sizing and grading machine



.C. F. KOCH.

TILE SIZING AND GRADING MACHINE.

APPLICATION FILED SEPT.-25, I9I2- Patented A11 8, 1.916.

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C. F. KOCH.

TILE SiZING AND GRADING MACHINE.

APPLICATiON FILED SEPT. 25. 1912.

Patelited Aug. 8, 1916.

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C. F. KGCH.

TILE SIZING AND GRADING MACHINE.

APPLICATION FILED SEPT. 25; 1912- 1 ,1 94,035. PatGntGdAug. 8,1916.

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CHARLES F. KOCH,

OF CINCINNATI,

OHIO.

TILE SIZING AND GRADING MACHINE.

Specification of Letters Patent.

Patented Arn 8, H916.

Application filed September 25, 1912. Serial No. 722,198.

To all 10 from it may concern:

Be it known that I, CHARLES'F. Keen, a citizen of the United States ofAmerica, and resident of Cincinnati, county of Hamilton, and State ofOhio, have invented certain new and useful Improvements in Tile Sizingand Grading Machines, of which the following is a specification.

This invention relates to tile grading and war-page testing ma chinesand has for an obj ect to produce a new and improved machine of thecharacter illustrated in Patent 1,066,239 issued to lVilliam K. Achert.

A further object is to produce a tile grading and warpage testingmachine in which means are employed for indicating different degrees ofwarpage or for grading the tile in accordance with the degree ofwar-page.

These and other objects I attain in a ma chine embodying the featuresherein described, and illustrated in the drawings accompanying andforming a part of this application.

In the drawings; Figure 1 is a side elevation of a machine embodying myinvention. Fig. 2 is a fragmental sectional view along the line 2-2 ofFig. 1. Fig. 3 is a sectional View along the line 3--3 of Fig. 1, and isshown in connection with a fragmental plan view of the tile supportingtable and conveyer. Fig. 4 is a fragmental sectional view along the line4-t of Fig. 3, portions being broken away and omitted, for convenienceof illustration.

The apparatus illustrated as an embodiment of my invention includes atile-grading mechanism, similar to that disclosed in the patent to whichI have referred; it also ineludes two separate mechanisms for testingthe tiles for warpage, and a conveyer for moving the tiles to be tested,along the machine, so that they are first engaged by the gradingmechanism and are then engaged by the successive warpagetestingmechanisms.

Referring more particularly to the drawings, throughout the separateviews of which like numerals indicate the same parts: The tile-gradingmechanism 6 illustrated, is mounted on the frame 7 of the machine insuch a position, that its reciprocating finger S is moved intoengagement with the edges of tiles traversing the tile way or tilesupporting table of the machine, An endless conveyer 9 is provided formoving tile along the way, and, as illustrated, consists of two separatechains, which are secured together 'warped a marked amount.

by means of tile bars 10, and are mounted on rotatable gear wheels 12,journaled on the frame portion of the machine. The upper leg of eachchain is located in a slot 13, formed on the frame portion, and issupported by a chain support bar or guide 14,

similar to those illustrated. in the above 'i'nentioned patent, forimparting lnterniittent motion to the conveyer, but it will beunderstood. that other and various means may be employed for impartingthe desired motion to the corweycr.

The grading mechanism 6, illustrated, is adapted to stamp each tilegraded by it and to indicate by a characteristic mark the size of thetile. Various means may, however, be employed for indicating the size ofthe tile and it is not essential that they be stamped or marked. Afterthe tile have been engaged by the finger 8 of the grading mechanism andhave been stamped for the purpose of indicating their size, they areconveyed to a warpage testing mechanism 16, with which the machine isprovided.

The mechanism 16 is preferably so adjusted that it will only indicatetiles which are After each tile has been tested by the mechanism 16, itis conveyed along the machine to the warpage testing mechanism 17, whichis similar to ad-' the mechanism 16, but is preferably so justed that itwill indicate tile which are slightly warped or are warped to a lessdegree than those indicated by the mechanism 16. It will be understoodthat any number of warpag'e testing mechanisms may be employed and thateach mechanism may be ad jnsted so as .to indicate a di'llercnt degreeof tile warpage and that they may occupy any desired position along thetile way with relation to each other, and with relation to the tilegrading mechanism 6. With the arrangement of warpage testing mechanismsillustrated, the machine is capable of class ing the tiles, tested byit, in three classes; that is, perfect tile, tile warped a slightamount, and tile warped an objectirmable amount. Various means may beemployed for indicating to which class each tile belongs, but in thedrawings 1 have provided means for stamping and characteristicallymarking the warped tiles, so that tiles warped a small amount may bereadily distinguished from those warped an objectionable amount.

As illustrated, the tile warpage testing mechanisms are similar to eachother and consequently only one will be described in detail. Eachwarpage testing mechanism includes a series of movable pins 18, whichextend upwardly through the table 7 and are adapted to be engaged andmoved by a tile during the operation of testing it for warpage. The tilesupporting plate 15 is cut away to form a depression 19 which is solocated that it is bridged by the tile during the testing operation;that is, during the operation of pressing the tile against theprojecting points of the pins. Each mechanism also includes means forclamping or holding the tile in place on the tile way, during thetesting operation, and means controlled by the pins for indicatingwarpage of the tile.

My invention contemplates employing a plurality of the pins 18 and soarranging them that they engage each tile tested, at points near itsedges. As illustrated, the pins are divided into three sets; two endsets and an intermediate set. Three pins are included in each end setand are located on each side of the tile support plate 15, so that theyproject through portions of the tile way, which form the stationaryabutments, against which the ends of the tile are pressed during thetesting operation. Two pins 18 are included in the intermediate set andthey project upwardly through the depressed portion of the tile plate 15and are preferably located midway between the outer sets of pins and insuch positions that they engage each tile tested at points located nearthe lateral edges of the tile. It will be understood that no center pinis employed, and that consequently, the machine indicates warpage at theedges of the tile only. Tiles warped a slight amount in the centers onlyand having unwarped edges are not considered objectionable since suchwarpage is not apparent and is therefore not detrimental. For thisreason my machine is an improvement over machines employing center pins,since a slight amount of warpage at the center of a tile will cause suchmachines to indicate that the tile is warped an objectionable amount,when in fact it is as good as a perfect tile for all practical purposes.Tiles warped an objectionable amount at the center are bound to bewarped along one of their edges, and consequently will be indicated aswarped tile by my machine.

The pins 18 are so arranged that each pin operates, during the testingoperation, to complete an electric circuit, when it is moved down apre-determined amount by the tile tested, or when it is not engaged bythe tile or is not moved from its normal or upper position.

Each pin 18 is supported on the upper end of a pin support rod 21 and isheld in place by means of a block 22, which is firmly secured on the pinand forms a removable cap for the supporting rod, since it is providedwith an aperture or way into which the upper end of the support rodprojects. Each block 22 is also provided with a sight hole 23, whichexposes the point of contact between the pin and the support rod, andtherefore discloses Whether the pin is in positive engagement with thebar 21 or is moved out of the proper position relatively thereto, bydirt or other foreign material.

The longitudinal motion of the pin supporting rods 21, occasioned bypressure of tile on the ends of the pins 18 during the testingoperation, is limited by means of plates 26 and 27 through which eachrod 21 projects. Each rod 21 is reduced in diameter at its upper andlower ends, so as to provide the shoulders 21 and 25, which respectivelyengage the plates 26 and 27 and thereby limit the motion of the rods.The plate 26 is provided with suitably located apertures, of suchdiameter that the upper ends, or reduced portions of the rods 21 maypass freely through them without contacting with the plate. Theapertures, however, are not large enough to permit the larger portionsof the rods to pass therethrough, and consequently the shoulders 2 1 arenormally held against the plate by means of coiled springs 28, each ofwhich surrounds the lower reduced portion of one of the rods 21 and islocated between a collar 29 on the rod and a plate 31, which issuspended from the plate 27, but is insulated therefrom. The lower endsof the rods 21 extend through apertures formed in the plate 27 which,like the apertures in the plate 26, permit the reduced portion of therod to pass freely therethrough without contacting with the plate, butthey are not of suliicient size to permit the larger portion of the rodto pass. WVith this arrangement the shoulders 25 of the rods contactwith the plate 27 when the pins 18 are moved downwardly, and the plate27 there fore limits the downward motion of the pins. Each of the plates26 and 27 is provided with a sheet 32 of insulating material, throughwhich the reduced portions of the rods 21 project and which is employedfor the purpose of holding the rods centrally with relation to theapertures in the plate, to which it is secured, and to thereby preventthe reduced portions from contacting with the plates. The plates 26 and27 are movable toward and away from each other, so that the positions ofthe pins 18 above the surface of the tile way may be varied, and so thatthe amount which each pin is capable of moving without forcing theshoulder 25 of its corresponding support rod into contact with the plate27, may be varied.

The plates 28 and 27 are mounted on the frame portion of the machine inthe following manner: A frame 33 is secured to the frame portion 7 bymeans of bolts 34 and is insulated from the frame portion by means ofinsulating sleeve-washers 35, which surround the shank portions of thebolts and are located between the bolts and the plate, as illustrated inFig. 2. Two depending bolts 36 are secured on opposite sidesof the frame33, and support a plate 37, which extends transversely of the frame 7 ofthe machine. Each bolt 36 extends through each of the plates 26 and 27and forms guides for the plates as they are moved toward and away fromeach other. Sleeves 38 are rigidly secured to the plate 26 and,extending along the bolts, form a guide for the plate during its motionalong the bolt, and also aid in holding it firmly in a horizontalposition. Two sleeves 39 are secured to the plate 27, and each sleeve islocated concentric with one of the bolts 36, surrounds, and slides uponone of the sleeves 38. In this manner the motion of the plate 27 isguided and the plate is held firmly in a horizontal position.

The plates 26 and 27 are moved along their supporting bolts by means ofa screw bar 40, which is provided with two sets of oppositely locatedscrew threads, one set of which engages a suitably threaded aperture 41in the plate 26 and the other of which engages a similar aperture 41 inthe plate 27. (See Figs. 2 and 4.) The screw threads are so arranged onthe bar 40 that the plates 26 and 27 are moved equal amounts in oppositedirections when the bar is turned. (The bar 40 is broken away in Fig. 4and a portion is omitted from the drawing for convenience ofillustration.) The lower end of the bar is not provided with screwthreads and it projects through a longitudinall extending aperture,formed in a screw 42, and is provided at its lower end with a cap 43,which is provided with a graduated scale, as shown in Fig. 2. The rod 40is also provided with an integrally formed collar 4-4, which is adaptedto rest upon the upper end of the screw 42 and to thereby support therod on the screw 42. The screw 42 is screwed into a suitably threadedaperture in the plate 37 and as shown, is provided at its lower end witha capstan head 45, which is located adjacent to the cap 43.

The operation of adjusting the pins 18 is as follows: The screw-bar 40is turned, by means of its cap 43, so that the plates 26 and 27 movetoward each other and respectively engage the shoulders 24 and 25 formedon the rods 21. This clamps the rods in place and holds them rigid withrespect to the plates, so that they will move up or down with theplates, as the plates are moved in the same direction. The screw 42 isthen turned in the proper direction, so that it raises or lowers theplates 26 and 27, through the agency of the collar 4!: and rod 40, bothof which remain stationary, relatively to the plates, until the pins 18are moved to a position, such that their upper ends are flush with thetile si'lpporting surfaces of the ways, The screw 42 is then clamped inposition and the pins 18 are projected the desired amount above the tilesupporting surface of the way by turning the screw 40, so as to move theplates 26 and 27 apart. This motion of the plates permits the rods 21 tomove upwardly with the plate 26 in response to the pressure of theirsprings 28 and also renders it possible to move each pin 18 and its rod21 downwardly, an amount equal to twice the length of the projectingupper end of the pin. In the apparatus illustrated the aperture formedin the plate 37, and through which the screw 42 extends, is slotted ondiametrically opposite sides and the plate is provided with the usualclamp nuts or screws 46, for clamping the screw 42 in position after theadjustment of the pins has been made. It will of course be understoodthat the rods 21 must be accurately machined, so that the distancebetween the shoulders 24 and 25 is the same on all of the rods, and sothat the length of the upper end of each of the rods is the same. Thepins 18 must also be carefully machined, so that they are all of thesame length. I

The upper projecting ends of the would prevent the tiles'from beingmoved along the tile way and into position over the depression 19,unless means were provided for raising the tiles so that they clear thepins as they are moved to position across the depression 19. In themachine illustrated I have provided a bridge 47, the cord or flangemembers of which project upwardly through the tile supporting table andare yieldingly held in their uppermost positions above the upper ends ofthe pins 18. As illustrated, the bridge consists" of two cord or flangemembers 48, which are preferably made of fibrous mater'al, and twotransverse mem bore 49, which, for the sake of rigidity, are preferablymade of metal. The transverse members are located near the ends of thecord members and the cord members may be rigidly secured thereto in anysuitable manner. The bridge is made tiltable by being held in theuppermost position by means of pins 18 yieldingly projected fingers 51,the lower ends of which extend through suitable apertures provided inthe frame Each finger is surrounded by a coiled spring 52, whichoperates between the frame 33 and an adjustable nut carried by thefinger, and the upper end of each finger supports one of thetransversely extending members a9 of the bridge, but is insulatedtherefrom by means of an insulating socket 53. The fingers arepreferably located centrally with relation to the members 19 and eachmember is provided with adjusting screws 54. which engage the lowerfaces of the chain support bars 14, and thereby limit the upward motionof the bridge. The screws 5 1 are provided for the purpose of adjustingthe position of the bridge to compensate for the wear of the fiber cordmembers. As illustrated, the cord members are located on the outside ofthe chains 9 and immediately adjacent to the depression 19 formed in thetile support plate.

During the operation of the machine a tile is moved, by the coiiperationof the conveyer and one of the conveyer bars 10, up onto the bridge andin position immediately over the depression 19 and the projecting endsof the pins 18. The operating mechanism of the conveyor is so timed thatthe conveyor comes to rest when a tile is in position on the bridge andremains at rest until the tile has been tested. During the testingoperation the tile on the bridge is moved downwardly by means ofclamping fingers 55 and is pressed into contact with supporting surfacesor edges provided on removable plates 56, which are so located as toform a portion of the tile way. If the tile is a perfect tile it willmove all of the pins downwardly, so that their upper ends are flush withthe tile supporting edges of the plates 56, and so that the rods 21 aremoved out of metallic contact with both of the plates 26 and 27. If thetile is warped it will permit at least one of the pins to occupy itsnormal position, so that its corresponding rod 21 remains in metalliccontact with the plate 26, or it will force at least one of the pins ofthe center set downwardly, so that its corresponding rod 21 is forcedinto metallic contact with the plate 27. This, as will hereinafter bedescribed, will actuate the tile marking means and will indicate thatthe tile is warped a certain degree. The degree of warpage indicated byeach tile testing mechanism is determined by the relative positions ofthe plates 26 and 27 and the amount the pins 18 project above thesurface of the tile supporting table, and may be varied by the screw410, through the agency of the cap 13, as has been previously explained.The cap 4-3 is preferably so graduated that the pins may be elevatedrelatively small amounts above the tile warping ways, such for exampleas two or three onethousandths of an inch.

The means employed in the illustrated machine for clamping the tiles inplace on the plates 56 is similar to the means illustrated in the patentto which I have previously referred. The fingers 55 are removablymounted on a plate 58 which is loosely mounted on the lower end of areciprocating rod 59, shown broken away in Fig. 2. The rod is actuatedthrough the agency of a lever 61, a link 62 and a bell crank 63, bymeans of the driving shaft 6 1 of the machine. The bell crank isoperatively connected to the link 62 by means of a sleeve 60, mounted onthe link and a spring restrained lost motion connection which is clearlydescribed in the before mentioned patent and which prevents the clampfingers 55 from exerting a breaking pressure on the tile.

The plates 56, against which the fingers 55 move a tile, during thetesting operation, are removably secured in place on the frame 7 of themachine, so that they can be replaced by plates of different size whenit is desired to test tile of different size.

The tile marking device employed with each of the testing devices 16 and17 is similar to that disclosed in the patent, to which I havepreviously referred, and consists of a type bar 65, an actuating hammer66 and an electro-magnet 67, which is mounted on the frame of themachine and receives actuating current from any suitable source ofsupply, such for example as a battery 68.

As illustrated, one terminal 69 of the battery is electrically connectedto one terminal of each of the magnets by means of Wires 71. Each of theother terminals of the electromagnets 67 is electrically connected bymeans of a wire 72 to a separate current interrupter, similar to the oneillustrated in the patent to which I have referred.

Each current interrupter consists of a movable contact 73, to which thewire 72 is connected, and a stationary contact 7 1, which iselectrically connected to both of the plates 26 and 27 of one of thecorresponding testing mechanisms. Each contact 7 3 is mounted on one ofthe sleeves 60, which forms a part of the spring restrained lost motionconnection and which is actuatedby the bell crank 63 for the purpose ofmoving the fingers 55 into clamping engagement with the tile to betested. The contact 73 is so located that it moves into engagement withthe contact 74 after the fingers 55 are in clamping engagement with thetile and in this way it completes the electrical connection between theplates 26 and 27 and the 'electro-magnet 67. The plate 31 iselectrically connected to the frame portion of the machine, which iselectrically connected to the terminal 76 of the battery 68 by means ofa wire 77. During the testing operation current flows from the battery68 through the winding of the electro-magnet 67, when the contact 7 3 isin engagement with the contact 7 1, provided one or more of the pinsupport rods 21 are moved into electrical contact with one or the otherof the plates 26 or 27 The pin support rods complete the electricalconnection between the plates 26 and 27 and the plate 31, which is shownconnected to the frame 7 by a wire 78, and thereby complete the circuitthrough the frame 7 of the machine and the wire 77.

hen a warped tile is tested and one or more of the pins 18 remain intheir uppermost position, or are forced by the tile to their lowestposition, one or the other, or both, of the plates 26 and 27 are placedin metallic circuit with the frame 7 by means of their engagement withthe shoulders of the pin-supporting rods 21, and through the agency ofthe wire 77; consequently current flows from the battery 68 through oneof the wires 71, the winding of the corresponding electro-magnct 67, thecorresponding wire 72, the contacts 73 and 74:, one or the other or bothof the plates 26 and 27, the plate 31, and the wire 78, back to thebattery. This completes the operating circuit of the electro-magnet 67and causes it to actuate the warpage indicating mechanism, it beingunderstood that the contact 73 of the circuit breaker is moved intoengagement with the contact 74.

The grading mechanism 6 and the warpage testing mechanisms 16 and 17 arelocated equal distances apart and are so positioned along the frame 7that the intermittently moving conveyor first moves atile along the tileway to the proper position with relation to the grading mechanism 6,where it remains stationary during the sizing operation. The tile isthen moved by the conveyor to the warpage testing mechanism 16, where itremains stationary during the testing operation, and after it has beentested it is moved to the mechanism 17 which is so adjusted that it willindicate tile war-page not indicated by the mechanism 16. The tilecontinues its intermittent motion along the frame of the machine afterit leaves the mechanism 17 and is finally received, at the tile deliveryend of the machine, by the operator or by mechanical means provided forreceiving the tile as they are delivered. The relative positions of thegrading and testing mechanisms determines the length of each forwardmovement of the conveyor and consequently means similar to thoseillustrated in the patent, to which I have previously referred, areprovided for varying the amount of motion transmitted-to the conveyerduring each of its forward movements. I find it convenient to soproportion the movement of the con-1 usted positions.

veyer that each tile traversing the machine, besides stopping at each ofthe mechanisms 6, l6 and 17, will stop midway between the gradingmechanism 6 and the testing mechanism l6 and midway between themechanisms 16 and 17, as it, moves along the machine. The tile bars 10are so spaced along the conveyer that tile on the conveyer will besimultaneously located in the proper operative positions relatively tothe grading mechanism and to each of the testing mechanisms.

In order to provide for wear, which may be encountered between the linksof the conveyer chains 9, and the consequent lengthening of thedistances between the tile bars 10 on the conveyer, I have providedmeans for shifting the positions of the grading mechanism 6, and thewarpage testing mechanism 17 with relation to the warp-age testingmechanism 16. As illustrated, longitudinally extending slots 80 areprovided in the frame 7 of the machine for receiving the bolts whichsecure the yoke 81 to the frame, (see Fig. 3) and similar slots are alsoprovided in the frame for the bolts 34, so

that the tile clamping devices and the plates 26 and 27, together withthe cooperating parts of the mechanism 17 may be shifted to differentpositions along the frame and then rigidly secured in place in their ad-With such a constructlon it is necessary to provide means for varyingthe positions of the apertures through which the upper ends of the pins18 project, so that the pins may be maintained vertically in alladjustments of the plates 26 and 27. This is accomplished in theillustrated apparatus by providing shiftable plates or strips 82 whichextend from a point indicated at 83 in Fig. 3, to the rear or tiledelivery end of the machine. The plates 56 are mounted on the plates 82and are consequently shiftable with them. The plate 15, along which thetile move during the operation of themachine, is also cut at some point,as is indicated at 85 in Fig. 3 and the rear portion of it is capable ofbeing adjusted longitudinally of the frame for the purpose ofmaintaining the intermediate set of pins 18 in the proper position. Anysuitable means may be provided for securing the plates 82 and theshiftable portions of the plate 15 to the frame 7, so that they can beadjusted longitudinally of the frame. In the apparatus illustrated Ihave employed counter-sunk screw-headed bolts for this purpose, whichextend through longitudinal slots provided in the frame. The tilegrading mechanism 6 is also capable of being shifted longitudinallv ofthe machine, so that the distance between it and the mechanism 16 can bevaried to accommodate the variations in the length of the chains 19.This is accomplished by providing longitudinally extending slots on I,

the frame 7, through which the holding bolts of the mechanism 6 extend.The type bar operating rods 86, fully described in the patent to whichreference has been made, are also made adjustable to accommodate themovement of the mechanisms 8 and 17 I have found that it is unnecessaryto vary the position of the fulcrum point of the bell crank 63, whichoperates the plate 58 and the fingers of the mechanism 17, since theconnection between the bell crank and the lever 61 is suflicientlyflexible to permit the mechanism 17 to be moved to adjusted positionswithout in any way affecting the operation of the apparatus.

I11 Fig. 1 I have shown an improved means for varying the pressuretransmitted by the fingers 55 of the two clamping plates 58. The means,as illustrated, includes an extensible connecting rod 87, which isemployed for actuating the bell crank (33 of the mechanism 16 and whichis pivotally con nected to the bell crank and to the crank disk 88,carried by the driving shaft 64L. By varying the length of theconnecting rod 87 the positions of both of the sleeves are va- -riedrelatively to their mounting 1inks62,

and consequently the tension of the restraining springs with which theycooperate is also varied.

The operation of the apparatus is somewhat as follows: Tile to be gradedare placed on the intermittently moving conveyer so that one edge ofeach tile is engaged by one of the tile bars 10. The conveyer operatesso that it moves each tile to a position under the grading mechanism andopposite to the end of the grading finger 8. hen a tile is in thisposition the finger moves into contact with one of its edges, and themechanism operates to indicate the size of the tile. After the tile hasbeen marked by the grading mechanism, the conveyer advances and moves itonto the bridge and over the pins 18 of the mechanism 16. This movementof the conveyer also advances another tile to position under the gradingmechanisms and the machine operates to grade a tile during the time itoperates to test the first tile for warpage. During the warpage testingoperation the tile on the bridge is first engaged by the fingers 55 andis then moved downwardly against the edges of the plates 56 and incontact with the upper ends of the pins 18. As the tile is moved downagainst the fingers the contact 73 is moved into contact with thecontact 74, so that one or another of the rods 21 may complete theoperating circuit of the electromagnet 67 by remaining in contact withthe plate 26 or engaging plate 27. If the circuit is completed theelectro-magnet aetuates its armature and stamps the tile to indicatethat it is warped to a marked degree. The conveyer then advances thefirst tile until it is moved onto the bridge of the mechanism l7.Simultaneously with this opera tion the conveyer moves a tile under thegrading mechanism 6 and advances a tile, which has been graded, to aposition on the bridge of the mechanism 16. The operation of themechanism 17 is similar to that of the mechanism 16, except that it isso adjusted that it indicates tile which are warped a less amount thanwill be indicated by the mechanism 16. After the tile has been tested bythe mechanism 17 it is moved toward the delivery end of the machine, andother tile are moved to position on the bridge of the mechanism. Thedriving mechanisms of the tile grading and warpage testing mechanismsare so arranged that the mechanisms operate simultaneously andconsequently the machine illustrated, in effect, grades and tests a tilefor warpage each time the conveyer is zulvanced.

In accordance with the United States patent statutes I have illustratedand described the preferred embodiment of my invention, but, I desire itto be imderstood that various changes, modifications and substitutionsmay be made in the details of construction without departing from thespirit and scope of my invention, as set forth in the appended claims.

\Vhat I claim is:

1. In an apparatus of the character described, a way along which tileare movable, separate warpage testing mechanisms located along the way,for simultaneously grading tile in accordance with their various degreesof warpage, a conveyer for moving tile along the way, into engagementwith one mechanism and then the other and for simultaneously moving atile into engagement with each mechanism, driving means for periodicallyactuating the conveyer, separate clamping means for forcing each tileinto engagement with each of said mechanisms, and means actuated by saiddriving means for periodically and simultaneously actuating eachclamping means during periods of rest of the conveyer.

2. In an apparatus of the character described. means for grading tile inaccordance with the degree of their warpage and comprising a mechanismfor indicating a determined degree of warpage, a second mechanism forindicating a diflerent determined degree of warpage from that indicatedby the first mechanism and means for simultaneously moving a tile intoengagement with each mechanism.

3. In an apparatus of the character described, means for grading tile inaccordance with the degree of their warpage, comprising, cooperatingsets of movable pins for engaging the tile, a separate indicatingmechanism controlled by each. set of pins and periodically moving meansfor moving tile to be tested into engagement with one and then the otherof said sets of pins.

4. I11 an apparatus of the character described, means for grading tilein accordance with the degree of their warpage, comprising two sets ofmovable pins for engaging the tile, a separate indicating mechanismcontrolled by each set of pins, and periodically moving means for movingtile to be tested into engagement with one and then the other of saidsets of pins and for simultaneously moving tile into operative positions with relation to each set of pins.

5. In an apparatus of the character described, warpage testing meanscomprising separate cooperating sets of movable pins for engaging thetile, separate indicating mechanisms controlled by each set of pins,means for moving tile to be tested into engagement with one and then theother set of pins and separate sets of reciprocable fingers forsimultaneously pressing til-e into engagement with each set of pinsduring the testing operation.

6. In a machine oil the character described, means for grading tile inaccordance with the degree of their warpage, comprising separate sets ofmovable pins for engaging tile to be tested, a separate indicatingmechanism controlled by each set of pins, means for moving the tile tobe tested into engagement with one and then the other of said sets ofpins and for simultaneously moving tile into operative positions withrelation to each set of pins and a separate periodically moving meansfor pressing tile into engagement with each set of pins.

7. In a machine for grading tile in accordance with the degree of theirwarpage, separate supports for tile to be tested, a separate set ofmovable pins for engaging tile on each support, means for moving tile tobe tested from one support to the other, and separate periodicallymoving means for simultaneously pressing a tile against each supportduring each testing operation.

8. In a machine for grading tile in accordance with the degree of theirwar-page, separate supports for tile to be tested, a separate set ofmovable pins for engaging tile on each support, a conveyer for movingtile from one support to the other and for simultaneously moving a tileto each sup port, separate periodically moving devices forsimultaneously pressing tile against said supports and theircorresponding sets of pins, means for intermittently moving saidconveyer and means for actuating said devices during periods of rest ofsaid conveyer.

9. In a machine for testing the warpage of tile, separate sets ofmovable warpage testing pins, separate indicating mechanisms controlledby each set of pins, a conveyer for simultaneously moving tile tooperative posit1ons with relation to each set of pins,

separate periodically moving means for pressing a tile into engagementwith each set of pins, and for rendering each set oi pins operative incontrolling its respective indicating device, means for intermittentlymoving the conveyer and means for actuating both oi said tile pressingmeans during periods of rest of the conveyer.

10. In a \varpage testing mechanism for tile, separate sets of movablepins adapted to contact the edges of the tile, a separate indicatingmechanism for each set of pins, an intermittently moving conveyer formoving tile from an operative position, with relation to one set ofpins, to an operative position with relation tothe other set, a separate device for pressing tile, moved by the conveyer, into engagementwith each set of pins during periods of rest of the conveyer, means forintermittently moving the conveyer, means for periodically actuatingsaid devices, separate electrical devices controlled respectively byeach set of pins for actuating each its respective warpage indicatingmechanism, electric circuits including said pins and said devices, acircuit interrupter included in each circuit and means for moving saidinterru iters to circuit closing positions during periods of rest ofsaid conveyer.

11. In a machine for testing the warpage of tile, a way along which tileare movable, separate tile supports located at intervals along the way,separate sets of cooperating pins adapted to be engaged by tile on eachsupport, a conveyer for advancing tile along the way, means forintermittently moving the conveyer, separate devices for pressing tileagainst the supports and into engagement with the pins, means forsimultaneously actuating said devices during periods of rest of theconveyer, a war-page testing indicating mechanism for each set of pins,a separate electrical device controlled by each set of pins foractuating each mechanism, a separate electric circuit including pins ofeach set and each electrical device, a separate current interrupterlocated in each circuit, and means for simultaneously moving saidinterrupters to circuit closing posi tions during periods of rest of theconveyer.

12. A machine for testing tile comprising, a tile way along which tileare movable, warpage indicating pins n-ojecting upwardly through theway, yieldingly supported means for guiding tile moving along the way topositions above the projecting ends of the pins and means for depressingsaid yieldingly supported means and moving the tile into engagement withthe pins.

13. In a machine for testing the warpage of tile, a tile way, means formoving tile along the way, a pin projecting upwardly through the way, amovable bridge, yieldingly projected above the projecting end of thepin, for guiding tile traversing the way to a position above the pin,and means for depressing the bridge and thereby moving the tiledownwardly into engagement with the pin.

1-1. In a warpage testing mechanism, a tile way, a tile support, meansfor moving tile along the way, a movable bridge, located in the path oftravel of tile on the way, for guiding the tile to a position above thesupport, yielding supports for the bridge and means for depressing thebridge and moving the tile onto the support.

15. In an apparatus of the character described, a tile support, a pinprojecting therethrough, a movable bridge for guiding tile to a positionabove the support and the projecting end of the pin, means foryieldingly supporting the bridge, means for mov-' ing a tile onto thebridge and means for engaging a tile on the bridge and for depressingthe bridge and thereby pressing the tile down against the support.

16. In an apparatus of the character described, a tile support, a pinprojecting above the support, means for moving tile along the support, atiltable bridge for guiding tile to positions above the support, meansfor yieldingly supporting the bridge and means for moving the bridge andpressing the tile supported thereon against the support. i

17 In a warpage testing machine, a tile way, a tile support, means formoving tile along the way, a pin projecting upwardly through thesupport, a bridge for guiding tile traversing the way to a positionabove the support, and comprising longitudinally extending tilesupporting members which project upwardly through the support, andtransversely extending end members secured to the longitudinal members,yieldingly mounted pins on which the end members are loosely supportedand means for engaging a tile on the bridge, depressing the bridge andpressing the tile engaged against the support.

18. In a warpage testing mechanism, a tile way, means for moving tilealong the way, a tile support, pins projecting upwardly through thesupport, a bridge having tile supporting members projecting upwardlythrough the support, for guiding the tiles to a position above the pins,yieldingly mounted pins on which said bridge is loosely mounted andmeans for pressing a tile on the bridge against the support and intoengagement with the pins.

. 19. In a warpage testing mechanism, a tile support, pins projectingbeyond the tile supporting surface of the support and capable of beingengaged by a tile located on the support, yieldingly supported rods onwhich said pins are mounted, plates for limiting the motion of the rods,a warpage indicating mechanism, an electrical device for actuating saidmechanism, and a circuit including said rods, said plates and saidelectrical device.

20. In a warpage indicating machine, a tile support, a pin projectingabove the surface of the support and adapted to be engaged by a tilepassing over the support, a rod on which said pin is mounted, adjustable plates located adjacent to said pin and adapted to movably mountsaid rod and to limit the motion of said rod, said rod beingelectrically insulated from said plates for intermediate positions ofits movement, means for yieldingly holding the rod into electricalcontact with one of said plates, a warpage indicating mechanism, anelectrical device for actuating said mechanism and a circuit includingsaid plates, said rod and said electrical device.

21. In a warpage indicating device, a pin, a support rod for the pin,having plate engaging shoulders formed thereon, plates through whichsaid rod projects, means adapted to yieldingly maintain said rod incontact with one of said plates, and means for varying the positions ofthe plates relatively to each other for the purpose of adjusting theposition of the rod and pin.

22. In a warpage indicating device, a frame, a warpage indicating pin, asupport rod for the pin having plate engaging shoulders, plates movablymounted on the frame for limiting the motion of the rod, guides for theplates, means for moving the plates in the same direction along theguides or for moving the plates in opposite directions along the guidesfor the purpose of adjusting the position of the pin.

23. In a mechanism of the character described, a tile way, a conveyerfor moving tile along the way, a plurality of warpage testing mechanismslocated at intervals along the way, each mechanism being ad justed torespond to a different degree of tile warpage, indicating devicescontrolled by the mechanisms, means for intermittently moving theconveyer and means for simul taneously actuating all of said mechanismsduring periods of rest of the conveyer.

24. In a mechanism of the character described, a way along which tileare movable, two sets of war-page testing pins located along the way, aseparate indicating device controlled by each set of pins, anintermittently movable conveyer for moving tile along the way and forsimultaneously moving a tile to a testing position, with relation toeach set of pins, and separate periodically moving means forsimultaneously pressing a tile onto each set of pins during periods ofrest of said conveyer.

In an apparatus of the character described, a way along which tile to betested are movable, two sets of movable warpage testing pins spacedalong the way, an electrically actuated indicating device controlled byeach set of pins, an intermittently moving conveyer for moving tilealong the way and for simultaneously moving a tile into testingposition, with relation to each set of pins, a separate set ofperiodically moving fingers for simultaneously pressing a tile againsteach set of pins during periods of rest of said conveyer, and anelectric circuit controlled by each set of pins, including thecorresponding indicating device and a circuit breaker included in eachcircuit and actuated by the operating means of the cor responding set offingers.

26. In a warpage testing mechanism, a tile support, a plurality ofmovable pins projecting beyond the tile-supporting surface of thesupport and capable of being engaged by a tile located on the support, awarpage indicating mechanism, an electrical device for actuating themechanism, an electric circuit for controlling the operation of thedevice, a make and break device for controlling the operation of thecircuit, periodically actuated fingers for pressing tile to be testedagainst the support and against said movable pins, means for actuatingsaid fingers and for actuating said make and break device, a yieldingsupport for each pin included in said electric circuit, andmeans,'included in said circuit for limiting the motion of the pins,said means being electrically insulated from the pin supports, when thepins are located in an intermediate position, and in electrical contactwith the supports when the pins are located at one extreme position orthe other.

27. In a warpage testing mechanism, a support for engaging the edges oftiles to be tested, a plurality of movable pins for engaging the edgesof the supported face of a tile engaged by the support, a movable bridgelocated adjacent to the support, a conveyer for moving tile onto thebridge, means for pressing tile on the bridge against the support andinto engagement with said pins, means for intermittently actuating theconveyer, means for actuating said tile pressing means during periods ofrest of the conveyer and an indicating mechanism controlled by saidmeans.

28. In a machine of the character described, a sizing mechanism fortile, a warpage testing mechanism for indicating a determined degree oftile warpage, a second warpage testing mechanism for indicatingadifferent degree of warpage from that indicated by the first warpagetesting mechanism, periodically moving means for moving tile to'betested into engagement with one and then the other of said mechanismsand for simultaneously moving tile into engagement with each of saidmechanisms and' means for simultaneously actuating all Of saidmechanisms during periods of rest of said tile moving means.

29. In a mechanism of the character described, a way along which tileare movable, two sets of movable pins projecting above the way and inthe path of tile traveling along the way, a separate movable bridge forguiding tile to a position above each set of pins, an electric circuitcontrolled by each set of pins, an electrically actuated indicat ingdevice controlled by each circuit, an intermittently moving conveyer forconveying tile along the way from one set of pins to the other and forsimultaneously moving a tile in position on each bridge, a separate setof periodically moving fingers for engaging a tile located on eachbridge and for pressing it downwardly against the corresponding set ofpins, a circuit breaker in cluded in said circuit, and means, actuatedby the actuating means of said fingers, for

moving said circuit breaker to the closed position, during the pressingoperation of said fingers.

30. In a warpage testing apparatus, a support for tile to be tested, apin projecting above said support and movable to a position below thesupport, means yieldingly projected above the support and above theprojecting end of said pin, for supporting tile above the support andabove the projecting end of the pin, motion limiting means for said pin,an indicating device, an electrically actuated device for actuating saidindicating device, an electric circuit including said electric deviceand controlled by the cooperation of said motion limiting means and saidpin, and means for engaging a tile on said yieldingly projecting meansand for moving it into engagement with said pin and ontosaid support.

31. In a war-page testing apparatus, a support for tile to be tested, aset of movable pins for engaging the edges only of a tile to be testedand projecting above the tile supporting face of said support andcapable of being moved by a tile on the support below the supportingface of the support, a separate movable support rod for each pm,oppositely located plates for limiting the motion of said rods and forcontacting with the rods when they are in one extreme position or theother, an indicating device, electrical means for actuating said device,and an electric circuit for controlling the operation of said means,including both of said plates, said rods being located in series in saidcircuit and adapted to close said circult by engaging one or the otherof said plates when controlled by said pins.

32. In an apparatus of the character described, a tile support, a set ofmovable pins projecting above the support and capable of being moved toa position below the support by a tile on the support, a separatesupport rod for each pin, oppositely located plates for engaging thesupport rods and for limiting the motion of the pins in both directions,an indicating device, electrical means for actuating said device, anelectric circuit for controlling the operation of said electrical means,and including said plates and said support rods, said support rods beingso arranged that each rod is capable of closing the circuit When inengagement with one or the other of said plates, and means for adjustingthe positions of the plates relatively to each other, for varying theposition of the support rods.

33. In a Warpage indicating device, a Way along which tile are movable,a tile support located on the Way, a pin projecting above the tilesupport and capable of being moved by a tile on the support to aposition below the tile supporting face of the support, a movablebridge, projecting beyond the tile Way, for guiding a tile to aposition'above the support and above the projecting end of the pin, amovable support rod for the pin, motion limiting plates for limiting themo tion of the support rod and the pm, an indicating device, means,controlled by the E. W. MCCALLISTER, WV. THORNTON Boenn'r.

Copies of this patent may be obtained for five cents each, by addressingthe Commissioner of Patents. Washington, D. G.

